Inventor · disambiguated record
Hyung-Dong Kim
Also filed as: KIM HYUNG J · KIM HYUNG-DONG
23 granted patents·5 pending applications·238 citations·filing 1994–2023
95Inventor score
Files withSAMSUNG ELECTRONICS CO LTD20KWON HYUNG-SHIN2LG DISPLAY CO LTD2KANG SANG SEOK1KIM HYUNG-DONG1
Top patents by PatentIndex Score
28 records- 0196US8052295B2Backlight assembly and liquid crystal display device having the sameLG DISPLAY CO LTD·Filed 2006·Granted Nov 8, 2011·44 cites·6 claims
- 0289US7365571B2Input buffer with wide input voltage rangeSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Apr 29, 2008·16 cites·5 claims
- 0382US6724242B2Pump circuits and methods for integrated circuits including first and second oscillators and first and second pumpsSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Apr 20, 2004·34 cites·17 claims
- 0473US9865495B2Semiconductor device and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jan 9, 2018·2 cites·24 claims
- 0572US7173872B2Method and apparatus for controlling a high voltage generator in a wafer burn-in testSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Feb 6, 2007·7 cites·10 claims
- 0669US6856563B2Semiconductor memory device for enhancing bitline precharge timeSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Feb 15, 2005·16 cites·23 claims
- 0768US6535447B2Semiconductor memory device and voltage level control method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Mar 18, 2003·17 cites·10 claims
- 0868US6426902B1Semiconductor memory device having redundancy circuit capable of improving redundancy efficiencySAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Jul 30, 2002·17 cites·20 claims
- 0966US7016248B2Method and apparatus for controlling a high voltage generator in a wafer burn-in testSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Mar 21, 2006·12 cites·16 claims
- 1065US8415225B2Methods of manufacturing semiconductor devicesKWON HYUNG-SHIN·Filed 2011·Granted Apr 9, 2013·2 cites·9 claims
- 1164US6707738B2Semiconductor memory device having mesh-type structure of precharge voltage lineSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Mar 16, 2004·14 cites·25 claims
- 1264US6301171B2Semiconductor memory device capable of reducing data test time in pipelineSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Oct 9, 2001·14 cites·20 claims
- 1363US5768174AIntegrated circuit memory devices having metal straps to improve word line driver reliabilitySAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Jun 16, 1998·22 cites·9 claims
- 1460US8208317B2Semiconductor memory deviceKANG SANG-SEOK·Filed 2009·Granted Jun 26, 2012·4 cites·17 claims
- 1559US8558347B2Semiconductor devices and methods of manufacturing the sameKWON HYUNG-SHIN·Filed 2013·Granted Oct 15, 2013·1 cites·11 claims
- 1657US7476983B2Semiconductor device including wire bonding pads and pad layout methodSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jan 13, 2009·2 cites·18 claims
- 1757US2024222468A1Method for fabricating semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1855US7324399B2Refresh control circuit and method for performing a repetition refresh operation and semiconductor memory device having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jan 29, 2008·3 cites·23 claims
- 1954US7922368B2Light module and flat light unit in a liquid crystal display deviceLG DISPLAY CO LTD·Filed 2007·Granted Apr 12, 2011·1 cites·9 claims
- 2054US2014346782A1Micro power generator and power generation method using liquid dropletPUSAN NAT UNIV IND COOP FOUND·Filed 2013·Application pending·0 cites
- 2145US8264904B2Method of estimating self refresh period of semiconductor memory deviceKIM HYUNG-DONG·Filed 2010·Granted Sep 11, 2012·2 cites·20 claims
- 2244US2008211542A1Input buffer with wide input voltage rangeSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 2338US5742197ABoosting voltage level detector for a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1994·Granted Apr 21, 1998·6 cites·21 claims
- 2437US2006290414A1Charge pump circuit and semiconductor memory device having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 2534US2005112838A1Method for forming inductor of semiconductor deviceFiled 2003·Application pending·0 cites
- 2632US5886933ABoost voltage generator for controlling a memory cell arraySAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Mar 23, 1999·2 cites·13 claims
- 2730US8051341B2Semiconductor memory device having test address generating circuit and method of testing semiconductor memory device having a test address generating circuitSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Nov 1, 2011·0 cites·17 claims
- 2830US5640360AAddress buffer of semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Jun 17, 1997·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →