Inventor · disambiguated record
Hyongsoo Kim
Also filed as: KIM HYONGSOO
11 granted patents·1 pending application·56 citations·filing 2012–2023
88Inventor score
Top patents by PatentIndex Score
12 records- 0190US9147685B2Semiconductor memory devices including support patternsSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Sep 29, 2015·14 cites·10 claims
- 0289US9159729B2Capacitor of semiconductor device and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Oct 13, 2015·17 cites·16 claims
- 0387US10903310B2Capacitor structure and semiconductor device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jan 26, 2021·2 cites·25 claims
- 0486US9917147B2Capacitor structure and semiconductor device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Mar 13, 2018·4 cites·20 claims
- 0583US11594595B2Capacitor structure and semiconductor device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 28, 2023·1 cites·13 claims
- 0681US8816418B2Semiconductor memory devices and methods of fabricating the sameKIM HYONGSOO·Filed 2012·Granted Aug 26, 2014·9 cites·16 claims
- 0774US9111953B2Integrated circuit devices with capacitor and methods of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Aug 18, 2015·4 cites·15 claims
- 0873US8835315B2Methods of fabricating semiconductor memory devices including support patternsBYUN KYUNGMUN·Filed 2012·Granted Sep 16, 2014·4 cites·15 claims
- 0964US9177793B2Methods of fabricating a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Nov 3, 2015·1 cites·19 claims
- 1062US12464698B2Semiconductor device and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Nov 4, 2025·0 cites·20 claims
- 1158US10665664B2Capacitor structure and semiconductor device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted May 26, 2020·0 cites·19 claims
- 1241US2016155793A1Semiconductor memory devices and methods of forming the sameKIM HYONGSOO·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →