Inventor · disambiguated record
Hyeongcheol Lee
Also filed as: LEE HYEONGCHEOL
10 granted patents·6 pending applications·247 citations·filing 2001–2024
90Inventor score
Files withSAMSUNG ELECTRONICS CO LTD7VISTEON GLOBAL TECH INC7AUTOMOTIVE COMPONENTS HOLDINGS1LEE HYEONGCHEOL1
Top patents by PatentIndex Score
16 records- 0191US6816804B1System and method for estimating velocity using reliability indexed sensor fusionVISTEON GLOBAL TECH INC·Filed 2003·Granted Nov 9, 2004·80 cites·20 claims
- 0290US7007782B2Control of a hydraulic coupling systemAUTOMOTIVE COMPONENTS HOLDINGS·Filed 2004·Granted Mar 7, 2006·32 cites·19 claims
- 0387US6575281B2Coupling deviceVISTEON GLOBAL TECH INC·Filed 2001·Granted Jun 10, 2003·31 cites·15 claims
- 0486US6795761B1Overall control algorithm for interactive vehicle control systemVISTEON GLOBAL TECH INC·Filed 2003·Granted Sep 21, 2004·38 cites·22 claims
- 0582US6681913B2Coupling deviceVISTEON GLOBAL TECH INC·Filed 2001·Granted Jan 27, 2004·24 cites·26 claims
- 0665US7032697B2Drive control system for vehicles with an auxiliary driving systemLEE HYEONGCHEOL·Filed 2002·Granted Apr 25, 2006·31 cites·13 claims
- 0763US2025244259A1Semiconductor inspection apparatus and method of manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0862US2024412943A1Substrate inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0959US2025218721A1Scanning electron microscope deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1058US12352808B2Substrate inspection apparatus and substrate inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Jul 8, 2025·0 cites·20 claims
- 1157US2025027875A1Optical imaging deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1256US2025037486A1Method of generating defect classification modelSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1355US2023332954A1Apparatus and method for inspecting and measuring semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1444US6859715B2Torque-biasing systemVISTEON GLOBAL TECH INC·Filed 2001·Granted Feb 22, 2005·4 cites·10 claims
- 1544US6591714B2Coupling deviceVISTEON GLOBAL TECH INC·Filed 2001·Granted Jul 15, 2003·4 cites·19 claims
- 1639US6882922B2Torque-biasing systemVISTEON GLOBAL TECH INC·Filed 2001·Granted Apr 19, 2005·3 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →