Inventor · disambiguated record
Hyung Wook Moon
Also filed as: MOON HYUNG WOOK
8 granted patents·1 pending application·9 citations·filing 2006–2009
78Inventor score
Technology areasG11C
Top patents by PatentIndex Score
9 records- 0161US7852134B2Circuit for controlling pulse width of auto-refresh signal and circuit for generating internal row address for auto refreshHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Dec 14, 2010·4 cites·10 claims
- 0250US7529146B2Semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted May 5, 2009·2 cites·21 claims
- 0349US7558144B2Circuit for controlling pulse width of auto-refresh signal and circuit for generating internal row address for auto refreshHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Jul 7, 2009·2 cites·19 claims
- 0446US7715259B2Word line driving circuit and method of testing a word line using the word line driving circuitHYNIX SEMICONDUCTOR INC·Filed 2008·Granted May 11, 2010·1 cites·12 claims
- 0541US7679981B2Semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Mar 16, 2010·0 cites·19 claims
- 0638US7826300B2Semiconductor memory apparatusHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Nov 2, 2010·0 cites·15 claims
- 0736US2009257300A1Fuse information control device, semiconductor integrated circuit using the same, and control method thereofHYNIX SEMICONDUCTOR INC·Filed 2008·Application pending·0 cites
- 0835US8009497B2Auto-refresh control circuit and a semiconductor memory device using the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Aug 30, 2011·0 cites·16 claims
- 0930US8169843B2Wafer test trigger signal generating circuit of a semiconductor memory apparatus, and a wafer test circuit using the sameMOON HYUNG-WOOK·Filed 2008·Granted May 1, 2012·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →