Inventor · disambiguated record

Hyun-Deok Park

Also filed as: PARK HYUN-DEOK

1 granted patent·32 citations·filing 1998–1998

45Inventor score

Technology areasG01R

Files withSAMSUNG ELECTRONICS CO LTD1

Top patents by PatentIndex Score

1 record

0163US6286117B1Circuits and methods for testing logic devices by modulating a test voltage with a noise signalSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Sep 4, 2001·32 cites·27 claims

Join the waitlist — get patent alerts

Get an alert when Hyun-Deok Park files or is granted a new patent.

We store only your email — no account needed. See our privacy policy.

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →