Inventor · disambiguated record
Hyun-Seop Shim
Also filed as: SHIM HYUN-SEOP
14 granted patents·12 pending applications·119 citations·filing 1998–2015
92Inventor score
Files withSAMSUNG ELECTRONICS CO LTD11SAMSUNG ELECTRO MECH5SHIM HYUN-SEOP5AN YOUNG-SOO1IY HYUN-GUEN1
Top patents by PatentIndex Score
26 records- 0188US7554349B2Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environmentsSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jun 30, 2009·16 cites·24 claims
- 0284US7838790B2Multifunctional handler system for electrical testing of semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Nov 23, 2010·11 cites·21 claims
- 0379US8545721B2UV coating composition for LED color conversionSHIM HYUN-SEOP·Filed 2010·Granted Oct 1, 2013·4 cites·8 claims
- 0475US7438563B2Connector for testing a semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Oct 21, 2008·9 cites·32 claims
- 0572US8310771B2LED light converting resin composition and LED member using the sameSHIM HYUN-SEOP·Filed 2010·Granted Nov 13, 2012·2 cites·15 claims
- 0670US7084655B2Burn-in test apparatus for BGA packages using forced heat exhaustSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Aug 1, 2006·15 cites·16 claims
- 0768US8366008B2Radio frequency identification tag, and method of manufacturing the sameSAMSUNG ELECTRO MECH·Filed 2010·Granted Feb 5, 2013·3 cites·9 claims
- 0862US2011061707A1Dye-sensitized solar cells and mobile device including the sameSAMSUNG ELECTRO MECH·Filed 2009·Application pending·0 cites
- 0962US2011061727A1Dye-sensitized solar cells and mobile device including the sameSAMSUNG ELECTRO MECH·Filed 2009·Application pending·0 cites
- 1060US5959915ATest method of integrated circuit devices by using a dual edge clock techniqueSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Sep 28, 1999·25 cites·20 claims
- 1159US7327154B2Multichip package testSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Feb 5, 2008·3 cites·4 claims
- 1257US7227351B2Apparatus and method for performing parallel test on integrated circuit devicesSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jun 5, 2007·11 cites·20 claims
- 1355US7017428B2Test kit for semiconductor package and method for testing semiconductor package using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Mar 28, 2006·5 cites·25 claims
- 1454US6943577B2Multichip package testSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Sep 13, 2005·6 cites·2 claims
- 1548US8632205B2LED lighting module using AC powerSHIM HYUN-SEOP·Filed 2009·Granted Jan 21, 2014·0 cites·5 claims
- 1648US2011061904A1Display array substrate and method of manufacturing display substrateSAMSUNG ELECTRO MECH·Filed 2009·Application pending·0 cites
- 1748US2011006688A1Led lamp deviceSHIM HYUN-SEOP·Filed 2009·Application pending·0 cites
- 1847US2011031889A1Ac-powered led lighting systemSHIM HYUN-SEOP·Filed 2009·Application pending·0 cites
- 1941US6201746B1Test method for high speed memory devices in which limit conditions for the clock are definedSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Mar 13, 2001·9 cites·20 claims
- 2039US2007101219A1Semiconductor testing apparatus and method of calibrating the sameJANG SEUNG-HO·Filed 2006·Application pending·0 cites
- 2136US2016341372A1Led lamp capable of freely converting color temperature and method for converting color temperature using the sameSTCUBE INC·Filed 2015·Application pending·0 cites
- 2236US2006187647A1Test kit semiconductor package and method of testing semiconductor package using the sameIY HYUN-GUEN·Filed 2006·Application pending·0 cites
- 2334US2011043363A1Radio frequency identification tag, and method and mold for manufacturing the sameSAMSUNG ELECTRO MECH·Filed 2010·Application pending·0 cites
- 2434US2006076965A1Contact-free test system for semiconductor deviceAN YOUNG-SOO·Filed 2005·Application pending·0 cites
- 2529US2003115519A1Parallel testing system for semiconductor memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2002·Application pending·0 cites
- 2627US2006085715A1Test board of semiconductor tester having modified input/output printed circuit pattern and testing method using the sameKIM YONG-WOON·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →