Inventor · disambiguated record
Hye-Won Shim
Also filed as: SHIM HYE-WON
2 granted patents·1 pending application·3 citations·filing 2011–2017
43Inventor score
Top patents by PatentIndex Score
3 records- 0172US10157259B2Method and device for predicting reliability failure rate of semiconductor integrated circuit and method of manufacturing the semiconductor integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Dec 18, 2018·2 cites·20 claims
- 0265US10298214B2Clock switch device and system-on-chip having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted May 21, 2019·1 cites·20 claims
- 0333US2012112311A1Electrical Fuses Using Junction Breakdown and Semiconductor Integrated Circuits Including the SameCHO YONG SANG·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →