Inventor · disambiguated record
Hyo Seob Yoon
Also filed as: YOON HYO G · YOON HYO S · YOON HYO SEOB
12 granted patents·3 pending applications·17 citations·filing 2005–2016
85Inventor score
Top patents by PatentIndex Score
15 records- 0182US8975689B1Semiconductor apparatus having vertical channel transistor and method of fabricating the sameSK HYNIX INC·Filed 2014·Granted Mar 10, 2015·5 cites·20 claims
- 0275US7410909B2Method of removing ion implanted photoresistHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Aug 12, 2008·5 cites·8 claims
- 0372US7741671B2Capacitor for a semiconductor device and manufacturing method thereofHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Jun 22, 2010·4 cites·5 claims
- 0466US9337420B2Variable resistance memory device and method of manufacturing the sameSK HYNIX INC·Filed 2013·Granted May 10, 2016·1 cites·6 claims
- 0562US7498628B2Capacitor for a semiconductor device and manufacturing method thereofHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Mar 3, 2009·2 cites·14 claims
- 0654US9859493B2Variable resistance memory device and method of manufacturing the sameSK HYNIX INC·Filed 2016·Granted Jan 2, 2018·0 cites·9 claims
- 0753US9935267B2Variable resistance memory device with variable resistance material layerSK HYNIX INC·Filed 2016·Granted Apr 3, 2018·0 cites·9 claims
- 0849US9024291B2Resistive memory device and fabrication method thereofSK HYNIX INC·Filed 2013·Granted May 5, 2015·0 cites·7 claims
- 0948US7655535B2Method for fabricating semiconductor device having trench isolation layerHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Feb 2, 2010·0 cites·6 claims
- 1047US2013134383A1Non-volatile memory device and method of manufacturing the sameSK HYNIX INC·Filed 2012·Application pending·0 cites
- 1146US8384056B2Phase change random access memory device and method of manufacturing the sameHYNIX SEMICONDUCTOR INC·Filed 2010·Granted Feb 26, 2013·0 cites·5 claims
- 1243US8916949B2Resistive memory device and method for manufacturing the sameSK HYNIX INC·Filed 2012·Granted Dec 23, 2014·0 cites·14 claims
- 1342US2015207068A1Resistive memory device and fabrication method thereofSK HYNIX INC·Filed 2015·Application pending·0 cites
- 1441USRE43765EMethod for fabricating semiconductor device having trench isolation layerYOON HYO SEOB·Filed 2012·Granted Oct 23, 2012·0 cites·6 claims
- 1536US2006219259A1Method of cleaning a semiconductor waferHYNIX SEMICONDUCTOR INC·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →