Inventor · disambiguated record
I-Che Lee
Also filed as: LEE I-CHE
18 granted patents·17 pending applications·6 citations·filing 2009–2025
88Inventor score
Top patents by PatentIndex Score
35 records- 0193US12040018B2Method for programming memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jul 16, 2024·2 cites·20 claims
- 0289US11527289B2Method for programming memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Dec 13, 2022·2 cites·20 claims
- 0389US11404477B2Memory array and method of forming thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Aug 2, 2022·2 cites·20 claims
- 0481US12281991B2Inspection layer to improve the detection of defects through optical systems and methods of inspecting semiconductor device for defectsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Apr 22, 2025·0 cites·20 claims
- 0580US12412787B2Manufacturing process with atomic level inspectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Sep 9, 2025·0 cites·20 claims
- 0679US2025336817A1Metallization layer and fabrication methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0778US12424548B2Metallization layer and fabrication methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Sep 23, 2025·0 cites·20 claims
- 0878US12417806B2Method for programming memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Sep 16, 2025·0 cites·20 claims
- 0978US2024371707A1Manufacturing process with atomic level inspectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1077US2025216342A1Inspection Layer to Improve The Detection of Defects Through Optical Systems and Methods of Inspecting Semiconductor Device for DefectsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1175US2025149387A1Method for non-destructive inspection of cell etch redepositionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1274US11761905B2Inspection layer to improve the detection of defects through optical systems and methods of inspecting semiconductor device for defectsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Sep 19, 2023·0 cites·20 claims
- 1373US12218014B2Method for non-destructive inspection of cell etch redepositionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Feb 4, 2025·0 cites·20 claims
- 1471US11856793B2Memory array and method of forming thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Dec 26, 2023·0 cites·20 claims
- 1570US12131957B2Manufacturing process with atomic level inspectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Oct 29, 2024·0 cites·20 claims
- 1667US12002755B2Metallization layer and fabrication methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 4, 2024·0 cites·20 claims
- 1763US10644034B2Array substrate of display panelINNOLUX CORP·Filed 2017·Granted May 5, 2020·0 cites·17 claims
- 1862US9728554B2Array substrate of display panelINNOLUX CORP·Filed 2014·Granted Aug 8, 2017·0 cites·18 claims
- 1960US2025063720A1Semiconductor device and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 2060US2025248072A1Semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 2159US2025351411A1Transistor produced using improved metal oxide processTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 2258US2025351434A1Semiconductor device including source/drain unit with tunnel layer and method for manufacturing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 2358US2025287605A1Semiconductor device with low current leakage and method for manufacturing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 2457US2024410854A1Semiconductor structure, integrated circuit and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 2557US2025254916A1Semiconductor structure including intermediate conductive layers and method for manufacturing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 2656US2024414924A1Ferroelectric random access memory device and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 2754US2025133820A1Insertion layer between channel and passivation for transistorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 2854US2025031388A1Capacitor having a bottom capacitor plate with a rough upper surface, semiconductor device including the capacitor and and methods of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 2953US11894297B2Metal-insulator-metal capacitor having electrodes with increasing thicknessTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Feb 6, 2024·0 cites·20 claims
- 3052US11862665B2Semiconductor structure including MIM capacitor and method of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jan 2, 2024·0 cites·20 claims
- 3149US11749569B2Method for non-destructive inspection of cell etch redepositionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Sep 5, 2023·0 cites·20 claims
- 3245US10067600B2Touch display panelINNOLUX CORP·Filed 2016·Granted Sep 4, 2018·0 cites·13 claims
- 3345US2010258808A1Thin film transistor and manufacturing method thereofCHUNGHWA PICTURE TUBES LTD·Filed 2009·Application pending·0 cites
- 3444US2015071323A1Apparatus for identifying morphologyINNOLUX CORP·Filed 2014·Application pending·0 cites
- 3532US2016203353A1Electronic deviceINNOLUX CORP·Filed 2015·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when I-Che Lee files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →