Inventor · disambiguated record
I-Ching Li
Also filed as: LI I-CHING
17 granted patents·9 pending applications·5 citations·filing 2005–2023
86Inventor score
Top patents by PatentIndex Score
26 records- 0187US11852465B2Wafer inspection method and apparatus thereofGLOBALWAFERS CO LTD·Filed 2022·Granted Dec 26, 2023·2 cites·8 claims
- 0280US11041255B2Semi-insulating silicon carbide crystalline ingot having a resistivity larger than 10∧7 Ohm-cm and manufacturing method thereforGLOBALWAFERS CO LTD·Filed 2019·Granted Jun 22, 2021·1 cites·8 claims
- 0379US12076677B2Method for collecting dust from single crystal growth systemGLOBALWAFERS CO LTD·Filed 2023·Granted Sep 3, 2024·0 cites·10 claims
- 0478US9337375B2Seed used for crystalline silicon ingot castingSINO AMERICAN SILICON PROD INC·Filed 2013·Granted May 10, 2016·2 cites·2 claims
- 0571US11708642B2Mono-crystalline silicon growth apparatusGLOBALWAFERS CO LTD·Filed 2021·Granted Jul 25, 2023·0 cites·2 claims
- 0663US11845030B2Method for collecting dust from single crystal growth system and dust collecting system thereofGLOBALWAFERS CO LTD·Filed 2020·Granted Dec 19, 2023·0 cites·6 claims
- 0761US11859965B2Material analysis methodGLOBALWAFERS CO LTD·Filed 2022·Granted Jan 2, 2024·0 cites·8 claims
- 0859US10825940B2Polycrystalline silicon column and polycrystalline silicon waferSINO AMERICAN SILICON PROD INC·Filed 2016·Granted Nov 3, 2020·0 cites·7 claims
- 0957US11923422B2Semiconductor deviceGLOBALWAFERS CO LTD·Filed 2020·Granted Mar 5, 2024·0 cites·6 claims
- 1056US12044631B2Wafer surface defect inspection method and apparatus thereofGLOBALWAFERS CO LTD·Filed 2022·Granted Jul 23, 2024·0 cites·20 claims
- 1156US10297702B2Polycrystalline silicon column and polycrystalline silicon waferSINO AMERICAN SILICON PROD INC·Filed 2016·Granted May 21, 2019·0 cites·14 claims
- 1255US11326272B2Mono-crystalline silicon growth apparatusGLOBALWAFERS CO LTD·Filed 2019·Granted May 10, 2022·0 cites·7 claims
- 1354US9903043B2Crucible assembly and method of manufacturing crystalline silicon ingot by use of such crucible assemblySINO AMERICAN SILICON PROD INC·Filed 2015·Granted Feb 27, 2018·0 cites·11 claims
- 1451US2016359005A1Semiconductor deviceGLOBALWAFERS CO LTD·Filed 2016·Application pending·0 cites
- 1548US11377752B2Mono-crystalline silicon growth methodGLOBALWAFERS CO LTD·Filed 2019·Granted Jul 5, 2022·0 cites·5 claims
- 1648US2006095477A1Database synchronizing system and methodVIA TECH INC·Filed 2005·Application pending·0 cites
- 1745US9708727B2Stirring apparatus of ingot casting furnaceGLOBALWAFERS CO LTD·Filed 2015·Granted Jul 18, 2017·0 cites·7 claims
- 1843US2019106811A1Manufacturing method for silicon carbide crystalGLOBALWAFERS CO LTD·Filed 2018·Application pending·0 cites
- 1940US2006089940A1Instantaneous integrated system and method of heterogeneous databasesVIA TECH INC·Filed 2005·Application pending·0 cites
- 2040US2006095414A1System and method for integrating and transmitting dataVIA TECH INC·Filed 2005·Application pending·0 cites
- 2139US2019035946A1Solar cell waferSINO AMERICAN SILICON PROD INC·Filed 2018·Application pending·0 cites
- 2237US10347481B2Silicon carbide wafer and method for production thereofGLOBALWAFERS CO LTD·Filed 2017·Granted Jul 9, 2019·0 cites·4 claims
- 2337US2018273880A1Silicon wafer cleaner and method for cleaning silicon waferSINO AMERICAN SILICON PROD INC·Filed 2018·Application pending·0 cites
- 2433US2016293707A1Semiconductor deviceGLOBALWAFERS CO LTD·Filed 2016·Application pending·0 cites
- 2531US2018358443A1Silicon carbide wafer and positioning edge processing method thereofGLOBALWAFERS CO LTD·Filed 2017·Application pending·0 cites
- 2629US10053797B2Crystal growth apparatus and thermal insulation cover of the sameGLOBALWAFERS CO LTD·Filed 2015·Granted Aug 21, 2018·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →