Inventor · disambiguated record
I-Shih Tseng
Also filed as: TSENG I-SHIH
14 granted patents·5 pending applications·70 citations·filing 1997–2025
89Inventor score
Top patents by PatentIndex Score
19 records- 0188US11841381B2Wafer inspection method and inspection apparatusCHROMA ATE INC·Filed 2022·Granted Dec 12, 2023·1 cites·19 claims
- 0287US12253541B2Pogo pin cooling system and method and electronic device testing apparatus having the systemCHROMA ATE INC·Filed 2022·Granted Mar 18, 2025·1 cites·8 claims
- 0383US7804589B2System and method for testing light-emitting devicesCHROMA ATE INC·Filed 2009·Granted Sep 28, 2010·14 cites·3 claims
- 0483US2025298057A1Wafer inspection apparatusCHROMA ATE INC·Filed 2025·Application pending·0 cites
- 0574US12345741B2Wafer inspection method and inspection apparatusCHROMA ATE INC·Filed 2022·Granted Jul 1, 2025·0 cites·3 claims
- 0674US8525996B2Light emitting component measuring system and the method thereofCHENG HSU-TING·Filed 2011·Granted Sep 3, 2013·4 cites·7 claims
- 0770US6304119B1Timing generating apparatus with self-calibrating capabilityCHROMA ATE INC·Filed 2000·Granted Oct 16, 2001·22 cites·7 claims
- 0866US9429617B2Testing apparatus for light emitting diodesTSENG I-SHIH·Filed 2011·Granted Aug 30, 2016·3 cites·8 claims
- 0961US12196806B2Aging test system and aging test method for thermal interface material and electronic device testing apparatus having the systemCHROMA ATE INC·Filed 2022·Granted Jan 14, 2025·0 cites·10 claims
- 1060US12385947B2Direct liquid cooling system for electronic devices in sockets, method, and electronic device testing apparatus comprising the sameCHROMA ATE INC·Filed 2023·Granted Aug 12, 2025·0 cites·6 claims
- 1156US2025027987A1Inspection system with thermal interface, and electronic component inspection device and methodCHROMA ATE INC·Filed 2024·Application pending·0 cites
- 1255US12510563B2Pogo pin cooling system and electronic device testing apparatus having the systemCHROMA ATE INC·Filed 2023·Granted Dec 30, 2025·0 cites·1 claims
- 1349US9234933B2Solar cell testing system, solar cell testing method, and multifunctional testing light sourceCHROMA ATE INC·Filed 2012·Granted Jan 12, 2016·0 cites·6 claims
- 1446US6925415B2Method and system for measuring characteristics of liquid crystal display driver chipsCHROMA ATE INC·Filed 2003·Granted Aug 2, 2005·2 cites·7 claims
- 1543US2008266797A1Surface airflow heatsink device and the heatsink device componentsCHROMA ATE INC·Filed 2007·Application pending·0 cites
- 1643US2009161311A1Top mount surface airflow heatsink and top mount heatsink component deviceCHROMA ATE INC·Filed 2007·Application pending·0 cites
- 1740US6047114AMethod of constructing testing procedures for analog circuits by using fault classification tablesINST INFORMATION INDUSTRY·Filed 1997·Granted Apr 4, 2000·13 cites·20 claims
- 1837US6035114AMethod for constructing fault classification tables of analog circuitsINST INFORMATION INDUSTRY·Filed 1997·Granted Mar 7, 2000·10 cites·8 claims
- 1935US2012320369A1Optical measurement system and the device thereofCHENG HSU-TING·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →