Inventor · disambiguated record
Ichiro Ishimaru
Also filed as: ISHIMARU ICHIRO
23 granted patents·72 citations·filing 2001–2022
93Inventor score
Files withUNIV KAGAWA NAT UNIV CORP6NAT UNIV CORP KAGAWA UNIV5ISHIMARU ICHIRO3NEC CORP3HITACHI HIGH TECH CORP2
Top patents by PatentIndex Score
23 records- 0191US6894302B2Surface inspection apparatus and method thereofHITACHI HIGH TECH ELECT ENG CO·Filed 2001·Granted May 17, 2005·35 cites·7 claims
- 0289US7242016B2Surface inspection apparatus and method thereofHITACHI HIGH TECH CORP·Filed 2005·Granted Jul 10, 2007·11 cites·15 claims
- 0388US7417244B2Surface inspection apparatus and method thereofHITACHI LTD·Filed 2007·Granted Aug 26, 2008·9 cites·18 claims
- 0484US7952085B2Surface inspection apparatus and method thereofHITACHI LTD·Filed 2008·Granted May 31, 2011·6 cites·17 claims
- 0569US10386236B2Reflected light detecting device and reflected light detecting methodUNIV KAGAWA NAT UNIV CORP·Filed 2017·Granted Aug 20, 2019·1 cites·6 claims
- 0667US9513165B2Spectroscopic measurement deviceNAT UNIV CORP KAGAWA UNIV·Filed 2013·Granted Dec 6, 2016·1 cites·4 claims
- 0766US9488524B2Spectroscopic measurement device having diffraction grating at conjugate plane of relay lensNAT UNIV CORP KAGAWA UNIV·Filed 2013·Granted Nov 8, 2016·2 cites·16 claims
- 0864US9551670B2Surface inspection apparatus and method thereofHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 24, 2017·0 cites·11 claims
- 0964US8830462B2Optical characteristic measurement device and optical characteristic measurement methodISHIMARU ICHIRO·Filed 2012·Granted Sep 9, 2014·2 cites·15 claims
- 1063US12158417B1Spectrometry deviceUNIV KAGAWA NAT UNIV CORP·Filed 2022·Granted Dec 3, 2024·0 cites·10 claims
- 1162US9482576B2Spectroscopic measurement device having transmissive optical member with a sloped faceNAT UNIV CORP KAGAWA UNIV·Filed 2015·Granted Nov 1, 2016·1 cites·7 claims
- 1258US7204146B2Device and method for measuring thicknessTECHNO NETWORK SHIKOKU CO LTD·Filed 2006·Granted Apr 17, 2007·3 cites·14 claims
- 1357US12102430B2Spectral measurement device and spectral measurement methodUNIV KAGAWA NAT UNIV CORP·Filed 2022·Granted Oct 1, 2024·0 cites·14 claims
- 1457US9474476B2Spectral characteristics measurement device and spectral characteristics measurement methodNAT UNIV CORP KAGAWA UNIV·Filed 2013·Granted Oct 25, 2016·1 cites·8 claims
- 1555US8729514B2Surface inspection apparatus and method thereofISHIMARU ICHIRO·Filed 2011·Granted May 20, 2014·0 cites·19 claims
- 1654US11402270B2Spectral measurement device and spectral measurement methodUNIV KAGAWA NAT UNIV CORP·Filed 2019·Granted Aug 2, 2022·0 cites·16 claims
- 1749US11035782B2Optical characteristic measuring device and optical characteristic measuring methodUNIV KAGAWA NAT UNIV CORP·Filed 2017·Granted Jun 15, 2021·0 cites·17 claims
- 1847US12235157B2Spectrometry deviceUNIV KAGAWA NAT UNIV CORP·Filed 2020·Granted Feb 25, 2025·0 cites·13 claims
- 1947US11231272B2Optical measuring apparatus and optical measuring methodNEC CORP·Filed 2018·Granted Jan 25, 2022·0 cites·8 claims
- 2044US10545016B2Light measurement device and optical axis adjustment methodNEC CORP·Filed 2017·Granted Jan 28, 2020·0 cites·10 claims
- 2142US10503958B2Living body determination device, living body determination method, and programNEC CORP·Filed 2016·Granted Dec 10, 2019·0 cites·12 claims
- 2240US9778166B2Microparticle measurement deviceNAT UNIV CORP KAGAWA UNIV·Filed 2015·Granted Oct 3, 2017·0 cites·15 claims
- 2340US8988689B2Spectroscopic measurement device and spectroscopic measurement methodISHIMARU ICHIRO·Filed 2011·Granted Mar 24, 2015·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →