Inventor · disambiguated record
Ichiro Tachibana
Also filed as: TACHIBANA ICHIRO
12 granted patents·41 citations·filing 2007–2020
89Inventor score
Top patents by PatentIndex Score
12 records- 0186US7888640B2Scanning electron microscope and method of imaging an object by using the scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 15, 2011·9 cites·8 claims
- 0286US7875849B2Electron beam apparatus and electron beam inspection methodHITACHI HIGH TECH CORP·Filed 2007·Granted Jan 25, 2011·7 cites·12 claims
- 0382US8431893B2Electron beam apparatus and electron beam inspection methodFUKUDA MUNEYUKI·Filed 2012·Granted Apr 30, 2013·4 cites·2 claims
- 0481US8207498B2Electron beam apparatus and electron beam inspection methodFUKUDA MUNEYUKI·Filed 2011·Granted Jun 26, 2012·4 cites·2 claims
- 0577US7619219B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2007·Granted Nov 17, 2009·4 cites·6 claims
- 0676US9324540B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Apr 26, 2016·3 cites·4 claims
- 0775US7504626B2Scanning electron microscope and apparatus for detecting defectHITACHI HIGH TECH CORP·Filed 2007·Granted Mar 17, 2009·3 cites·23 claims
- 0867US8729467B2Charged particle radiation deviceTSUJI HIROSHI·Filed 2010·Granted May 20, 2014·2 cites·6 claims
- 0966US8222601B2Scanning electron microscope and method of imaging an object by using the scanning electron microscopeTACHIBANA ICHIRO·Filed 2011·Granted Jul 17, 2012·2 cites·8 claims
- 1065US10734191B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Aug 4, 2020·1 cites·13 claims
- 1163US10971328B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Apr 6, 2021·0 cites·15 claims
- 1262US8629410B2Charged particle radiation deviceTSUJI HIROSHI·Filed 2010·Granted Jan 14, 2014·2 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →