Inventor · disambiguated record
Idan Kaizerman
Also filed as: KAIZERMAN IDAN
26 granted patents·1 pending application·135 citations·filing 2012–2021
95Inventor score
Top patents by PatentIndex Score
27 records- 0193US9286675B1Iterative defect filtering processAPPLIED MATERIALS ISRAEL LTD·Filed 2014·Granted Mar 15, 2016·23 cites·20 claims
- 0291US11205119B2Method of deep learning-based examination of a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Dec 21, 2021·11 cites·20 claims
- 0390US9715723B2Optimization of unknown defect rejection for automatic defect classificationSHLAIN VLADIMIR·Filed 2012·Granted Jul 25, 2017·19 cites·21 claims
- 0490US9607233B2Classifier readiness and maintenance in automatic defect classificationKAIZERMAN IDAN·Filed 2012·Granted Mar 28, 2017·20 cites·19 claims
- 0586US12183066B2Method of deep learning-based examination of a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Dec 31, 2024·1 cites·17 claims
- 0686US11526979B2Method of defect classification and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Dec 13, 2022·2 cites·20 claims
- 0786US10161882B1Method of examining locations in a wafer with adjustable navigation accuracy and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Dec 25, 2018·4 cites·20 claims
- 0885US9858658B2Defect classification using CAD-based context attributesKAIZERMAN IDAN·Filed 2012·Granted Jan 2, 2018·9 cites·30 claims
- 0985US9595091B2Defect classification using topographical attributesKAIZERMAN IDAN·Filed 2012·Granted Mar 14, 2017·9 cites·26 claims
- 1084US10043264B2Integration of automatic and manual defect classificationGREENBERG GADI·Filed 2012·Granted Aug 7, 2018·17 cites·18 claims
- 1182US10748271B2Method of defect classification and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Aug 18, 2020·4 cites·20 claims
- 1280US11348001B2Method of deep learning-based examination of a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted May 31, 2022·3 cites·20 claims
- 1380US11010665B2Method of deep learning-based examination of a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted May 18, 2021·3 cites·18 claims
- 1478US10901402B2Closed-loop automatic defect inspection and classificationAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Jan 26, 2021·2 cites·11 claims
- 1573US10190991B2Method for adaptive sampling in examining an object and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Jan 29, 2019·2 cites·20 claims
- 1672US10360669B2System, method and computer program product for generating a training set for a classifierAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Jul 23, 2019·2 cites·20 claims
- 1770US10114368B2Closed-loop automatic defect inspection and classificationAPPLIED MATERIALS ISRAEL LTD·Filed 2013·Granted Oct 30, 2018·2 cites·20 claims
- 1867US10663407B2Method of examining locations in a wafer with adjustable navigation accuracy and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted May 26, 2020·0 cites·20 claims
- 1959US9715724B2Registration of CAD data with SEM imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2014·Granted Jul 25, 2017·2 cites·34 claims
- 2056US11080736B2Adaptive in-application physical product offersPLAYTIKA LTD·Filed 2018·Granted Aug 3, 2021·0 cites·18 claims
- 2156US10803575B2System, method and computer program product for generating a training set for a classifierAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Oct 13, 2020·0 cites·20 claims
- 2256US10720367B2Process window analysisAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Jul 21, 2020·0 cites·20 claims
- 2352US10049441B2Iterative defect filtering processAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Aug 14, 2018·0 cites·19 claims
- 2448US10896574B2System and method for outlier detection in gamingPLAYTIKA LTD·Filed 2018·Granted Jan 19, 2021·0 cites·20 claims
- 2548US10818000B2Iterative defect filtering processAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Oct 27, 2020·0 cites·20 claims
- 2645US10312161B2Process window analysisAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Jun 4, 2019·0 cites·16 claims
- 2742US2020210809A1System and method for outlier detection using a cascade of neural networksPLAYTIKA LTD·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →