Inventor · disambiguated record
Ikseon Jeon
Also filed as: JEON IKSEON
5 granted patents·3 pending applications·0 citations·filing 2020–2024
59Inventor score
Files withSAMSUNG ELECTRONICS CO LTD8
Top patents by PatentIndex Score
8 records- 0171US12474260B2Terahertz signal measuring apparatus and measuring methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Nov 18, 2025·0 cites·20 claims
- 0262US12474393B2Terahertz probeSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Nov 18, 2025·0 cites·17 claims
- 0362US12469750B2Method of extracting properties of a layer on a waferSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Nov 11, 2025·0 cites·20 claims
- 0461US2025003734A1Material measurement system and methodSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0555US11946881B2Inspection apparatus and inspection method using sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Apr 2, 2024·0 cites·20 claims
- 0655US11579168B2Probe for detecting near field and near-field detecting system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 14, 2023·0 cites·20 claims
- 0752US2024019362A1Probe and inspection apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0839US2021366102A1Inspection apparatus of waferSAMSUNG ELECTRONICS CO LTD·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →