Inventor · disambiguated record
Ilan Ben-Harush
Also filed as: BEN-HARUSH ILAN
5 granted patents·5 pending applications·0 citations·filing 2020–2025
59Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD10
Top patents by PatentIndex Score
10 records- 0170US12299868B2Control of a manufacturing process using contour curvature analysis of specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted May 13, 2025·0 cites·20 claims
- 0269US2025225642A1Stabilization of a manufacturing process of a specimen by shape analysis of structural elements of the specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2025·Application pending·0 cites
- 0359US2025264814A1Optimization of a metrology algorithm for examination of semiconductor wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0452US12347734B2Examination of a hole formed in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Jul 1, 2025·0 cites·21 claims
- 0552US2025004386A1Machine learning based metrology for semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0651US2024428395A1Optimization of a metrology algorithm for examination of semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0748US2025183001A1Calibration of an examination systemAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0847US11686571B2Local shape deviation in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Jun 27, 2023·0 cites·20 claims
- 0944US12272042B2Detection of defects using a computationally efficient segmentation approachAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Apr 8, 2025·0 cites·20 claims
- 1044US11443420B2Generating a metrology recipe usable for examination of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Sep 13, 2022·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →