Inventor · disambiguated record
Ill-Hwan Jeoun
Also filed as: JEOUN ILL-HWAN
3 granted patents·42 citations·filing 1996–2001
68Inventor score
Files withSAMSUNG ELECTRONICS CO LTD3
Top patents by PatentIndex Score
3 records- 0161US5893050AMethod for correcting thin-film formation program of semiconductor device and thickness measuring apparatus thereforSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Apr 6, 1999·30 cites·6 claims
- 0242US6303999B1Interconnect structure with a passivation layer and chip padSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Oct 16, 2001·12 cites·12 claims
- 0333US6596633B2Method for manufacturing a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Jul 22, 2003·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →