Inventor · disambiguated record
Il-Chan Park
Also filed as: PARK IL-CHAN
1 granted patent·2 pending applications·14 citations·filing 2006–2006
36Inventor score
Files withSAMSUNG ELECTRONICS CO LTD3
Top patents by PatentIndex Score
3 records- 0179US7138812B2Probe cardSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Nov 21, 2006·14 cites·20 claims
- 0238US2007066094A1Package having balls designed to reduce contact resistance, test apparatus for testing the package, and method of manufacturing the packageSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 0329US2006279314A1Test supporting device and method of testing using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →