Inventor · disambiguated record
Inkap Chang
Also filed as: CHANG INKAP
1 granted patent·1 pending application·0 citations·filing 2011–2023
6Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
2 records- 0147US12474400B2Method and system for testing and manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Nov 18, 2025·0 cites·19 claims
- 0224US2011202297A1Product sorting method based on quantitative evaluation of potential failureSAMSUNG ELECTRONICS CO LTD·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →