Inventor · disambiguated record
In Huh
Also filed as: HUH IN · HUH IN SUNG
13 granted patents·9 pending applications·17 citations·filing 2014–2023
84Inventor score
Top patents by PatentIndex Score
22 records- 0191US9276239B2Method for manufacturing a flexible display device by removing foreign particlesSAMSUNG DISPLAY CO LTD·Filed 2014·Granted Mar 1, 2016·9 cites·14 claims
- 0282US9553280B2Organic light-emitting diode (OLED) display comprising flexible substrate, electronic device including the same, and method of manufacturing the OLED displaySAMSUNG DISPLAY CO LTD·Filed 2015·Granted Jan 24, 2017·7 cites·19 claims
- 0376US2024086603A1Device for generating verification vector for circuit design verification, circuit design system, and reinforcement learning method of the device and the circuit design systemSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0473US11861280B2Device for generating verification vector for circuit design verification, circuit design system, and reinforcement learning method of the device and the circuit design systemSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jan 2, 2024·0 cites·20 claims
- 0568US11886783B2Simulation system for semiconductor process and simulation method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Jan 30, 2024·0 cites·17 claims
- 0666US11281832B2Device for generating verification vector for circuit design verification, circuit design system, and reinforcement learning method of the device and the circuit design systemSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Mar 22, 2022·0 cites·12 claims
- 0759US9515092B2Display device and method of manufacturing the sameSAMSUNG DISPLAY CO LTD·Filed 2015·Granted Dec 6, 2016·1 cites·20 claims
- 0858US11574095B2Simulation system for semiconductor process and simulation method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Feb 7, 2023·0 cites·17 claims
- 0957US2024211736A1Method and apparatus for inferring semiconductor measurement results based on artificial intelligenceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1052US12430880B2Method and system performing pattern clusteringSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Sep 30, 2025·0 cites·19 claims
- 1151US2024001408A1Apparatus for manufacturing semiconductor device and method of manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1250US11681947B2Method and apparatus for selecting model of machine learning based on meta-learningSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jun 20, 2023·0 cites·15 claims
- 1350US2022207393A1Method of predicting semiconductor material properties and method of testing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Application pending·0 cites
- 1448US12207537B2Display devices and manufacturing method thereofSAMSUNG DISPLAY CO LTD·Filed 2020·Granted Jan 21, 2025·0 cites·8 claims
- 1548US11669773B2Electronic devices generating verification vector for verifying semiconductor circuit and methods of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jun 6, 2023·0 cites·20 claims
- 1648US11507801B2Method for detecting defects in semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Nov 22, 2022·0 cites·20 claims
- 1748US2023229841A1Method and system for simulating and verifying layout based on distributionSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1845US12175177B2Method and apparatus with system verification based on reinforcement learningSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Dec 24, 2024·0 cites·18 claims
- 1944US2021174201A1Computing device, operating method of computing device, and storage mediumSAMSUNG ELECTRONICS CO LTD·Filed 2020·Application pending·0 cites
- 2043US2024320402A1Method, device, and system for estimating threshold value of kernel density function with respect to defect of productSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 2141US2024028910A1Modeling method of neural network for simulation in semiconductor design process, simulation method in semiconductor design process using the same, manufacturing method of semiconductor device using the same, and semiconductor design system performing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 2236US2021056425A1Method and system for hybrid model including machine learning model and rule-based modelSAMSUNG ELECTRONICS CO LTD·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →