Inventor · disambiguated record
In-Taek Oh
Also filed as: OH IN HEE · OH IN-TAEK
14 granted patents·1 pending application·53 citations·filing 2003–2021
90Inventor score
Top patents by PatentIndex Score
15 records- 0190US9245997B2Method of fabricating a LDMOS device having a first well depth less than a second well depthMAGNACHIP SEMICONDUCTOR LTD·Filed 2014·Granted Jan 26, 2016·13 cites·16 claims
- 0288US8575702B2Semiconductor device and method for fabricating semiconductor deviceCHA JAE-HAN·Filed 2010·Granted Nov 5, 2013·11 cites·14 claims
- 0387US9184304B2Multi-source JFET deviceMAGNACHIP SEMICONDUCTOR LTD·Filed 2014·Granted Nov 10, 2015·7 cites·14 claims
- 0482US8362556B2Semiconductor deviceMAGNACHIP SEMICONDUCTOR LTD·Filed 2010·Granted Jan 29, 2013·7 cites·7 claims
- 0580US8546883B2Semiconductor deviceCHA JAE-HAN·Filed 2010·Granted Oct 1, 2013·4 cites·3 claims
- 0679US8853787B2High voltage semiconductor deviceMAGNACHIP SEMICONDUCTOR LTD·Filed 2012·Granted Oct 7, 2014·5 cites·15 claims
- 0773US8969161B2Semiconductor device and method for fabricating semiconductor deviceMAGNACHIP SEMICONDUCTOR LTD·Filed 2013·Granted Mar 3, 2015·3 cites·14 claims
- 0867US8076726B2Semiconductor deviceCHA JAE-HAN·Filed 2010·Granted Dec 13, 2011·2 cites·6 claims
- 0960US8546881B2Semiconductor deviceCHA JAE-HAN·Filed 2010·Granted Oct 1, 2013·1 cites·10 claims
- 1056US8716796B2Semiconductor deviceMAGNACHIP SEMICONDUCTOR LTD·Filed 2013·Granted May 6, 2014·0 cites·11 claims
- 1156US8692328B2Semiconductor deviceMAGNACHIP SEMICONDUCTOR LTD·Filed 2013·Granted Apr 8, 2014·0 cites·5 claims
- 1251US9099557B2Semiconductor deviceMAGNACHIP SEMICONDUCTOR LTD·Filed 2013·Granted Aug 4, 2015·0 cites·12 claims
- 1348US8552497B2Semiconductor deviceCHA JAE-HAN·Filed 2011·Granted Oct 8, 2013·0 cites·5 claims
- 1440US12100508B2Method for predicting maximal oxygen uptake in wearable devicesSAMSUNG ELETRONICA DA AMAZONIA LTDA·Filed 2021·Granted Sep 24, 2024·0 cites·10 claims
- 1532US2004181961A1Handler for testing semiconductor deviceMIRAE CORP·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →