Inventor · disambiguated record
Ingrid Rink
Also filed as: RINK INGRID · RINK INGRID ANNEMARIE
2 granted patents·1 pending application·3 citations·filing 2002–2007
43Inventor score
Technology areasH10P
Top patents by PatentIndex Score
3 records- 0143US6775350B2Method of examining a wafer of semiconductor material by means of X-raysKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Aug 10, 2004·1 cites·5 claims
- 0238US2009090392A1Method of cleaning a semiconductor waferNXP BV·Filed 2007·Application pending·0 cites
- 0335US7625826B2Method of manufacturing a semiconductor device and an apparatus for use in such a methodNXP BV·Filed 2004·Granted Dec 1, 2009·2 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →