Inventor · disambiguated record

Ingo Weitzel

Also filed as: WEITZEL INGO

3 granted patents·57 citations·filing 1982–1985

69Inventor score

Technology areasH01J

Files withSIEMENS AG3

Top patents by PatentIndex Score

3 records

0183US4645929AMethod and apparatus for the compensation of charges in secondary ion mass spectrometry (SIMS) of specimens exhibiting poor electrical conductivitySIEMENS AG·Filed 1985·Granted Feb 24, 1987·49 cites·14 claims
0246US4465935AElectrically conductive sample support-mounting for secondary ion mass spectrometer analysisSIEMENS AG·Filed 1982·Granted Aug 14, 1984·7 cites·11 claims
0326US4851672ASpecimen mount for secondary ion mass spectrometry and other sensitive particle beam analysis methods and method for the operation thereofSIEMENS AG·Filed 1984·Granted Jul 25, 1989·1 cites·11 claims

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