Inventor · disambiguated record
Ippei Takahashi
Also filed as: TAKAHASHI IPPEI
13 granted patents·1 pending application·97 citations·filing 1988–2022
89Inventor score
Files withFUJI PHOTO FILM CO LTD5FUJIFILM TOYAMA CHEMICAL CO LTD3DENSO CORP2FUJIFILM CORP2SHIGETA BUNGO1
Top patents by PatentIndex Score
14 records- 0189US4954723ADisk surface inspection method and apparatus thereforFUJI PHOTO FILM CO LTD·Filed 1989·Granted Sep 4, 1990·55 cites·4 claims
- 0285US11348844B2Semiconductor wafer including silicon carbide wafer and method for manufacturing silicon carbide semiconductor deviceDENSO CORP·Filed 2021·Granted May 31, 2022·2 cites·6 claims
- 0384US10565545B2Drug inspection support apparatus and methodFUJIFILM TOYAMA CHEMICAL CO LTD·Filed 2015·Granted Feb 18, 2020·7 cites·20 claims
- 0483US9922419B2Drug information acquisition device and methodFUJIFILM CORP·Filed 2015·Granted Mar 20, 2018·4 cites·16 claims
- 0572US10007993B2Inspection device, inspection method, and computer readable medium storing program causing computer to perform inspection methodFUJIFILM CORP·Filed 2016·Granted Jun 26, 2018·2 cites·15 claims
- 0669US10896764B2Drug inspection apparatus and methodFUJIFILM TOYAMA CHEMICAL CO LTD·Filed 2015·Granted Jan 19, 2021·2 cites·20 claims
- 0766US8654333B2Surface inspection apparatus and methodSHIGETA BUNGO·Filed 2011·Granted Feb 18, 2014·2 cites·15 claims
- 0861US11651864B2Drug inspection apparatus and methodFUJIFILM TOYAMA CHEMICAL CO LTD·Filed 2020·Granted May 16, 2023·0 cites·19 claims
- 0954US6670627B2Apparatus and method for continuous surface examination comprising a light shielding member at outer ends of the examined surfaceFUJI PHOTO FILM CO LTD·Filed 2002·Granted Dec 30, 2003·1 cites·23 claims
- 1050US12032062B2Obstacle detection apparatusDENSO CORP·Filed 2022·Granted Jul 9, 2024·0 cites·12 claims
- 1143US4982105ASurface inspecting apparatus with strip width dividing meansFUJI PHOTO FILM CO LTD·Filed 1989·Granted Jan 1, 1991·10 cites·5 claims
- 1239US2018151364A1Method of manufacturing semiconductor deviceTOYOTA MOTOR CO LTD·Filed 2017·Application pending·0 cites
- 1338US4868403ASurface inspecting apparatusFUJI PHOTO FILM CO LTD·Filed 1988·Granted Sep 19, 1989·8 cites·4 claims
- 1432US5166535ASurface inspecting apparatus with surface inspection width adjustmentFUJI PHOTO FILM CO LTD·Filed 1990·Granted Nov 24, 1992·4 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →