Inventor · disambiguated record
Isaac Daniel Buzaglo
Also filed as: BUZAGLO ISAAC DANIEL
2 granted patents·1 pending application·17 citations·filing 2015–2024
57Inventor score
Top patents by PatentIndex Score
3 records- 0189US12020417B2Method and system for classifying defects in wafer using wafer-defect images, based on deep learningCAMTEK LTD·Filed 2020·Granted Jun 25, 2024·3 cites·19 claims
- 0279US9684960B2Automated histological diagnosis of bacterial infection using image analysisPANGEA DIAGNOSTICS LTD·Filed 2015·Granted Jun 20, 2017·14 cites·20 claims
- 0368US2024289945A1Method and system for classifying defects in wafer using wafer-defect images, based on deep learningCAMTEK LTD·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →