Inventor · disambiguated record
Isamu Hatanaka
Also filed as: HATANAKA ISAMU · KONDO ASAJI
12 granted patents·462 citations·filing 1979–1996
93Inventor score
Top patents by PatentIndex Score
12 records- 0190US5684509AMethod and apparatus for processing imageFUJI PHOTO FILM CO LTD·Filed 1994·Granted Nov 4, 1997·132 cites·9 claims
- 0289US5052785AColor liquid crystal shutter having more green electrodes than red or blue electrodesFUJI PHOTO FILM CO LTD·Filed 1990·Granted Oct 1, 1991·93 cites·11 claims
- 0381US4605972AImage forming methodFUJI PHOTO FILM CO LTD·Filed 1984·Granted Aug 12, 1986·48 cites·9 claims
- 0481US4488810AChemical analyzerFUJI PHOTO FILM CO LTD·Filed 1980·Granted Dec 18, 1984·39 cites·7 claims
- 0576US4689666AMethod for eliminating noise in regions of a color image exhibiting a specific colorFUJI PHOTO FILM CO LTD·Filed 1986·Granted Aug 25, 1987·31 cites·8 claims
- 0675US4250010AIntegrated ion selection electrode deviceFUJI PHOTO FILM CO LTD·Filed 1979·Granted Feb 10, 1981·24 cites·3 claims
- 0774US4629675AProcess for thermal development and transferFUJI PHOTO FILM CO LTD·Filed 1984·Granted Dec 16, 1986·14 cites·4 claims
- 0868US5050001APrinting system with liquid crystal shutter matrix panelFUJI PHOTO FILM CO LTD·Filed 1990·Granted Sep 17, 1991·28 cites·9 claims
- 0966US4850675ALight gate array having gates of different areasFUJI PHOTO FILM CO LTD·Filed 1986·Granted Jul 25, 1989·26 cites·7 claims
- 1048US4783145AMultiple gradation dot-matrix picture forming methodFUJI PHOTO FILM CO LTD·Filed 1986·Granted Nov 8, 1988·9 cites·10 claims
- 1147US5693286ACart mounting a welding torch or cutting torchKOIKE SANSO KOGYO KK·Filed 1996·Granted Dec 2, 1997·16 cites·8 claims
- 1236US4296422AImage recording material and image recording method using the sameFUJI PHOTO FILM CO LTD·Filed 1979·Granted Oct 20, 1981·2 cites·13 claims
Join the waitlist — get patent alerts
Get an alert when Isamu Hatanaka files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →