Inventor · disambiguated record
Isao Miyazaki
Also filed as: MIYAZAKI ISAO
15 granted patents·4 pending applications·884 citations·filing 1992–2018
95Inventor score
Top patents by PatentIndex Score
19 records- 0194US5715020ARemote control system in which a plurality of remote control units are managed by a single remote control deviceTOSHIBA KK·Filed 1996·Granted Feb 3, 1998·299 cites·12 claims
- 0294US5619251ATwo-way CATV system and remote control systemTOSHIBA KK·Filed 1994·Granted Apr 8, 1997·205 cites·23 claims
- 0388US6185324B1Semiconductor failure analysis systemHITACHI LTD·Filed 1995·Granted Feb 6, 2001·95 cites·18 claims
- 0487US6542830B1Process control systemHITACHI LTD·Filed 1997·Granted Apr 1, 2003·93 cites·25 claims
- 0587US5841893AInspection data analyzing systemHITACHI LTD·Filed 1992·Granted Nov 24, 1998·76 cites·12 claims
- 0683US6757621B2Process management systemHITACHI LTD·Filed 2003·Granted Jun 29, 2004·35 cites·10 claims
- 0779US6404911B2Semiconductor failure analysis systemHITACHI LTD·Filed 2000·Granted Jun 11, 2002·21 cites·16 claims
- 0874US6330352B1Inspection data analyzing systemHITACHI LTD·Filed 2000·Granted Dec 11, 2001·11 cites·2 claims
- 0973US7052842B2Method for highly sensitive hybridization of nucleic acids, and method for gene analysis using the sameNGK INSULATORS LTD·Filed 2002·Granted May 30, 2006·5 cites·6 claims
- 1072US6628817B2Inspection data analyzing systemHITACHI LTD·Filed 2001·Granted Sep 30, 2003·9 cites·25 claims
- 1171US6529619B2Inspection data analyzing systemHITACHI LTD·Filed 2001·Granted Mar 4, 2003·9 cites·3 claims
- 1268US6339653B1Inspection data analyzing systemHITACHI LTD·Filed 2000·Granted Jan 15, 2002·7 cites·12 claims
- 1359US6185322B1Inspection system and method using separate processors for processing different information regarding a workpiece such as an electronic deviceHITACHI LTD·Filed 1997·Granted Feb 6, 2001·15 cites·14 claims
- 1450US7304001B2Fabrication methods of semiconductor integrated circuit device and photomaskRENESAS TECH CORP·Filed 2002·Granted Dec 4, 2007·4 cites·6 claims
- 1541US2002034326A1Inspection data analyzing systemFiled 2001·Application pending·0 cites
- 1638US2021333273A1Laboratory test kit and method for using the laboratory test kitBIOMEDICAL RES INSTITUTE CO LTD·Filed 2018·Application pending·0 cites
- 1737US2007248951A1Determination method and determination kitPENTAX CORP·Filed 2006·Application pending·0 cites
- 1837US2007141596A1Plate, determination kit, and determination method for immunoassayPENTAX CORP·Filed 2006·Application pending·0 cites
- 1921US6272917B1Draw-false twisting management systemTEIJIN LTD·Filed 1999·Granted Aug 14, 2001·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →