Inventor · disambiguated record
Isao Tottori
Also filed as: TOTTORI ISAO
11 granted patents·2 pending applications·170 citations·filing 1990–2015
89Inventor score
Top patents by PatentIndex Score
13 records- 0188US6265778B1Semiconductor device with a multi-level interconnection structureMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jul 24, 2001·63 cites·6 claims
- 0277US5479054ASemiconductor device with improved planarization propertiesMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Dec 26, 1995·55 cites·14 claims
- 0369US5047127AOzone generating methodMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Sep 10, 1991·22 cites·2 claims
- 0463US10496576B2Communication apparatusMITSUBISHI ELECTRIC CORP·Filed 2015·Granted Dec 3, 2019·1 cites·7 claims
- 0562US10151605B2Rotation angle detection device and rotation angle detection methodMITSUBISHI ELECTRIC CORP·Filed 2014·Granted Dec 11, 2018·1 cites·9 claims
- 0649US7764209B2Parallel data output control circuit and semiconductor deviceRENESAS TECH CORP·Filed 2008·Granted Jul 27, 2010·0 cites·5 claims
- 0749US6207987B1Semiconductor device having smooth surface for suppressing layer displacementMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Mar 27, 2001·14 cites·20 claims
- 0845US7978108B2Parallel data output control circuit and semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2010·Granted Jul 12, 2011·0 cites·9 claims
- 0943US6368956B2Method of manufacturing a semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Apr 9, 2002·1 cites·7 claims
- 1040US5930674ASemiconductor device with improved planarization propertiesMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jul 27, 1999·8 cites·8 claims
- 1136US2004021176A1Integrated circuit device and electronic deviceRENESAS TECH CORP·Filed 2003·Application pending·0 cites
- 1234US2002014680A1Semiconductor device and method of manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 2001·Application pending·0 cites
- 1332US5460691AMethod of treating surface of semiconductor substrateMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Oct 24, 1995·5 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →