Inventor · disambiguated record
Itai Afek
Also filed as: AFEK ITAI
7 granted patents·5 pending applications·6 citations·filing 2016–2023
73Inventor score
Top patents by PatentIndex Score
12 records- 0179US10605924B2Method and apparatus cross segment detection in a lidar systemGM GLOBAL TECH OPERATIONS LLC·Filed 2017·Granted Mar 31, 2020·4 cites·20 claims
- 0277US10066986B2Light emitting sensor having a plurality of secondary lenses of a moveable control structure for controlling the passage of light between a plurality of light emitters and a primary lensGM GLOBAL TECH OPERATIONS LLC·Filed 2016·Granted Sep 4, 2018·2 cites·5 claims
- 0373US11852852B2Patterned mirror edge for stray beam and interference mitigationAPPLE INC·Filed 2022·Granted Dec 26, 2023·0 cites·10 claims
- 0465US12449614B1Optical systems with one dimensional eye trackingAPPLE INC·Filed 2023·Granted Oct 21, 2025·0 cites·20 claims
- 0559US11513267B2Patterned mirror edge for stray beam and interference mitigationAPPLE INC·Filed 2019·Granted Nov 29, 2022·0 cites·12 claims
- 0656US2023309824A1Accommodation tracking based on retinal-imagingAPPLE INC·Filed 2023·Application pending·0 cites
- 0755US12313862B2Glint analysis using multi-zone lensAPPLE INC·Filed 2021·Granted May 27, 2025·0 cites·20 claims
- 0854US2023367117A1Eye tracking using camera lens-aligned retinal illuminationAPPLE INC·Filed 2023·Application pending·0 cites
- 0953US2024036325A1Optical Systems with Sequential IlluminationAPPLE INC·Filed 2023·Application pending·0 cites
- 1049US10591923B2Method and apparatus for parallel illumination by a VCSEL arrayGM GLOBAL TECH OPERATIONS LLC·Filed 2017·Granted Mar 17, 2020·0 cites·10 claims
- 1138US2019086513A1Method and apparatus for frame rate boosting in lidar arrayGM GLOBAL TECH OPERATIONS LLC·Filed 2017·Application pending·0 cites
- 1237US2019041865A1Method and Apparatus for Parallel Acquisition in Lidar ArrayGM GLOBAL TECH OPERATIONS LLC·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →