Inventor · disambiguated record

Ituo Kobayashi

Also filed as: KOBAYASHI ITUO

1 granted patent·11 citations·filing 2000–2000

33Inventor score

Technology areasG03F

Files withFUJITSU LTD1

Top patents by PatentIndex Score

1 record

0163US6603875B1Pattern inspection method, pattern inspection apparatus, and recording medium which records pattern inspection programFUJITSU LTD·Filed 2000·Granted Aug 5, 2003·11 cites·9 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →