Inventor · disambiguated record
Iwao Sakai
Also filed as: SAKAI IWAO
8 granted patents·112 citations·filing 1991–2004
86Inventor score
Top patents by PatentIndex Score
8 records- 0184US5650732ASemiconductor device test systemMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Jul 22, 1997·59 cites·19 claims
- 0258US6778944B2Method and system for managing dataJEOL LTD·Filed 2002·Granted Aug 17, 2004·5 cites·12 claims
- 0354US5962961AThermal field emission electron gunJEOL LTD·Filed 1997·Granted Oct 5, 1999·13 cites·8 claims
- 0450US5940303ASemiconductor device test systemMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Aug 17, 1999·22 cites·8 claims
- 0540US5317257ABurn-in apparatus and burn-in board removing method using movable cooling enclosureMITSUBISHI ELECTRIC CORP·Filed 1992·Granted May 31, 1994·9 cites·11 claims
- 0631US7617738B2Method and apparatus for measuring flow rate of fluidAVANCE TECHNE ACCENT CORP·Filed 2004·Granted Nov 17, 2009·2 cites·18 claims
- 0729US6454100B1Semiconductor element carrying equipmentMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Sep 24, 2002·0 cites·5 claims
- 0828US5223786ABurn-in deviceMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Jun 29, 1993·2 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →