Inventor · disambiguated record
Iwan W. Schie
Also filed as: SCHIE IWAN W
1 granted patent·1 pending application·3 citations·filing 2017–2018
20Inventor score
Top patents by PatentIndex Score
2 records- 0161US11599738B2Method for examining distributed objects by segmenting an overview imageLEIBNIZ INSTITUT PHOTONISCHE TECHNOLOGIEN EV·Filed 2017·Granted Mar 7, 2023·3 cites·19 claims
- 0234US2020383577A1Systems, device and methods providing a combined analysis of imaging and laser measurementLEIBNIZ INSTITUT PHOTONISCHE TECHNOLOGIEN EV·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →