Inventor · disambiguated record
J.E. Patrick Gagnon
Also filed as: GAGNON J E PATRICK
0 granted patents·2 pending applications·0 citations·filing 2006–2006
Files withTEXAS INSTRUMENTS INC2
Top patents by PatentIndex Score
2 records- 0145US2008056557A1System and method for analyzing a light beam of a wafer inspection tool or an exposure toolTEXAS INSTRUMENTS INC·Filed 2006·Application pending·0 cites
- 0241US2008055590A1System and method for analyzing a light beam of an exposure tool or a reticle inspection toolTEXAS INSTRUMENTS INC·Filed 2006·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when J.E. Patrick Gagnon files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →