Inventor · disambiguated record
Jae-Gyung Ahn
Also filed as: AHN JAE-GYUNG
26 granted patents·1 pending application·332 citations·filing 1996–2015
96Inventor score
Files withHYUNDAI ELECTRONICS IND6LG SEMICON CO LTD6XILINX INC5INTEGRATED DEVICE TECH4HYNIX SEMICONDUCTOR INC2
Top patents by PatentIndex Score
27 records- 0194US8350253B1Integrated circuit with stress insertsXILINX INC·Filed 2010·Granted Jan 8, 2013·39 cites·13 claims
- 0289US8354671B1Integrated circuit with adaptive VGG settingXILINX INC·Filed 2010·Granted Jan 15, 2013·11 cites·15 claims
- 0381US6373109B1Semiconductor device to more precisely reflect the claimed inventionHYNIX SEMICONDUCTOR INC·Filed 2000·Granted Apr 16, 2002·25 cites·4 claims
- 0480US8653844B2Calibrating device performance within an integrated circuitSADOUGHI SHARMIN·Filed 2011·Granted Feb 18, 2014·5 cites·18 claims
- 0580US7419748B1Photomask with reduced electrostatic discharge defectsINTEGRATED DEVICE TECH·Filed 2004·Granted Sep 2, 2008·17 cites·21 claims
- 0680US6096609AESD protection circuit and method for fabricating same using a plurality of dummy gate electrodes as a salicide mask for a drainLG SEMICON CO LTD·Filed 1998·Granted Aug 1, 2000·49 cites·12 claims
- 0779US6528381B2Method of forming silicideHYNIX SEMICONDUCTOR INC·Filed 2001·Granted Mar 4, 2003·26 cites·18 claims
- 0872US5953616AMethod of fabricating a MOS device with a salicide structureLG SEMICON CO LTD·Filed 1998·Granted Sep 14, 1999·33 cites·20 claims
- 0965US6730572B2Method of forming silicideHYUNDAI ELECTRONICS IND·Filed 2003·Granted May 4, 2004·12 cites·29 claims
- 1064US7772093B2Method of and circuit for protecting a transistor formed on a dieXILINX INC·Filed 2007·Granted Aug 10, 2010·2 cites·15 claims
- 1163US5874330AMethod for fabricating semiconductor deviceLG SEMICON CO LTD·Filed 1996·Granted Feb 23, 1999·22 cites·5 claims
- 1262US6077736AMethod of fabricating a semiconductor deviceLG SEMICON CO LTD·Filed 1996·Granted Jun 20, 2000·21 cites·26 claims
- 1359US6518135B1Method for forming localized halo implant regionsINTEGRATED DEVICE TECH·Filed 2001·Granted Feb 11, 2003·6 cites·22 claims
- 1458US8329568B1Semiconductor device and method for making the sameAHN JAE-GYUNG·Filed 2010·Granted Dec 11, 2012·2 cites·20 claims
- 1553US6362060B2Method for forming semiconductor device having a gate in the trenchHYUNDAI ELECTRONICS IND·Filed 2001·Granted Mar 26, 2002·4 cites·18 claims
- 1652US6110771AFabrication method of a semiconductor device using self-aligned silicide CMOS having a dummy gate electrodeLG SEMICON CO LTD·Filed 1999·Granted Aug 29, 2000·11 cites·8 claims
- 1748US7956385B1Circuit for protecting a transistor during the manufacture of an integrated circuit deviceXILINX INC·Filed 2010·Granted Jun 7, 2011·0 cites·18 claims
- 1848US7388262B2Nitrogen implementation to minimize device variationINTEGRATED DEVICE TECH·Filed 2004·Granted Jun 17, 2008·1 cites·10 claims
- 1948US5877532ASemiconductor device and method of manufacturing the sameLG SEMICON CO LTD·Filed 1997·Granted Mar 2, 1999·8 cites·36 claims
- 2047US6242311B1Method of fabricating a semiconductor device with silicided gates and peripheral regionHYUNDAI ELECTRONICS IND·Filed 1998·Granted Jun 5, 2001·10 cites·26 claims
- 2147US6180473B1Method for manufacturing semiconductor deviceHYUNDAI ELECTRONCIS IND CO LTD·Filed 1999·Granted Jan 30, 2001·14 cites·13 claims
- 2245US6846751B2Nitrogen implementation to minimize device variationINTEGRATED DEVICE TECH·Filed 2002·Granted Jan 25, 2005·2 cites·6 claims
- 2343US6261910B1Semiconductor device and method of manufacturing the sameHYUNDAI ELECTRONICS IND·Filed 1998·Granted Jul 17, 2001·6 cites·21 claims
- 2441US10103139B2Method and design of low sheet resistance MEOL resistorsXILINX INC·Filed 2015·Granted Oct 16, 2018·0 cites·15 claims
- 2538US2002047164A1Device isolation structure for semiconductor device and method of fabricating the sameHYUNDAI ELECTRONICS IND·Filed 2001·Application pending·0 cites
- 2636US6337254B1Method of forming trench isolation structure with dummy active regions and overlying discriminately doped conduction layerHYUNDAI ELECTRONICS IND·Filed 1999·Granted Jan 8, 2002·5 cites·6 claims
- 2724US6265114B1Method of generating mask data in fabricating semiconductor devicesHYUNDAI MICRO ELECTRONIC CO LT·Filed 1999·Granted Jul 24, 2001·1 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →