Inventor · disambiguated record
Jason Armstrong
Also filed as: ARMSTRONG JASON · ARMSTRONG JASON N
10 granted patents·1 pending application·12 citations·filing 2006–2023
82Inventor score
Top patents by PatentIndex Score
11 records- 0192US12238892B2Immersion cooling for integrated circuit devicesINTEL CORP·Filed 2020·Granted Feb 25, 2025·3 cites·15 claims
- 0274US11932425B2Rideshare adapter, a configurable-mass, distributed architecture rideshare dispenser for a rideshare adapter, and a method of operating the rideshare dispenserXTENTI LLC·Filed 2020·Granted Mar 19, 2024·1 cites·20 claims
- 0368US9275769B2Marking template for radiographyPCC STRUCTURALS INC·Filed 2013·Granted Mar 1, 2016·3 cites·14 claims
- 0464US9718565B1Configurable-mass, distributed architecture rideshare dispenser for launch vehicle and method of operation thereofTRISEPT CORP·Filed 2013·Granted Aug 1, 2017·4 cites·7 claims
- 0563US12222371B2Residual current monitoring type B with integrated self-test system and methodVERTIV CORP·Filed 2022·Granted Feb 11, 2025·0 cites·19 claims
- 0660US10683108B2Rideshare adapter, a configurable-mass, distributed architecture rideshare dispenser for a rideshare adapter, and a method of operating the rideshare dispenserTRISEPT CORP·Filed 2017·Granted Jun 16, 2020·1 cites·7 claims
- 0758US12424798B2Outlet in-rush current limiter for intelligent power stripVERTIV CORP·Filed 2023·Granted Sep 23, 2025·0 cites·20 claims
- 0852US2024118326A1System and method of virtualized energy metering for intelligent power distribution equipmentVERTIV CORP·Filed 2023·Application pending·0 cites
- 0943US9658172B2Method of inspecting a part using a marking template for radiographyPCC STRUCTURALS INC·Filed 2016·Granted May 23, 2017·0 cites·17 claims
- 1035US8397311B2Metrology probe and method of configuring a metrology probeCHOPRA HARSH DEEP·Filed 2010·Granted Mar 12, 2013·0 cites·28 claims
- 1128US7425826B2Selectively conductive structure wherein a magnetic conductor is sized to have a cross-section diameter similar to a Fermi wavelength of electronsCHOPRA HARSH DEEP·Filed 2006·Granted Sep 16, 2008·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →