Inventor · disambiguated record
Jason Bemis
Also filed as: BEMIS JASON
10 granted patents·26 citations·filing 2012–2023
86Inventor score
Files withOXFORD INSTRUMENTS ASYLUM RES INC5OXFORD INSTR AFM INC2OXFORD INSTR ASYLUM RES INC2PROKSCH ROGER B1
Top patents by PatentIndex Score
10 records- 0193US9841436B2AM/FM measurements using multiple frequency of atomic force microscopyOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2016·Granted Dec 12, 2017·5 cites·7 claims
- 0293US9453857B2AM/FM measurements using multiple frequency of atomic force microscopyOXFORD INSTR ASYLUM RES INC·Filed 2015·Granted Sep 27, 2016·6 cites·1 claims
- 0391US10444258B2AM/FM measurements using multiple frequency atomic force microscopyOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2017·Granted Oct 15, 2019·3 cites·3 claims
- 0487US11644478B2Automated optimization of AFM light source positioningOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2022·Granted May 9, 2023·2 cites·12 claims
- 0586US10557865B2Quantitative measurements using multiple frequency atomic force microscopyOXFORD INSTR AFM INC·Filed 2017·Granted Feb 11, 2020·2 cites·11 claims
- 0684US9297827B2Quantitative measurements using multiple frequency atomic force microscopyPROKSCH ROGER B·Filed 2012·Granted Mar 29, 2016·5 cites·14 claims
- 0771US9696342B2Quantitative measurements using multiple frequency atomic force microscopyOXFORD INSTR AFM INC·Filed 2016·Granted Jul 4, 2017·1 cites·14 claims
- 0870US9921242B2Automated atomic force microscope and the operation thereofOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2016·Granted Mar 20, 2018·1 cites·19 claims
- 0967US9383388B2Automated atomic force microscope and the operation thereofOXFORD INSTR ASYLUM RES INC·Filed 2015·Granted Jul 5, 2016·1 cites·18 claims
- 1066US12055560B2Automated optimization of AFM light source positioningOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2023·Granted Aug 6, 2024·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →