Inventor · disambiguated record
Jan Jacobus Benjamin Biemond
Also filed as: BIEMOND JAN JACOBUS BENJAMIN
4 granted patents·2 citations·filing 2018–2019
56Inventor score
Technology areasG01Q
Files withTNO4
Top patents by PatentIndex Score
4 records- 0177US11320457B2System and method of performing scanning probe microscopy on a substrate surfaceTNO·Filed 2019·Granted May 3, 2022·2 cites·16 claims
- 0245US11698389B2Probe, method of manufacturing a probe and scanning probe microscopy systemTNO·Filed 2018·Granted Jul 11, 2023·0 cites·20 claims
- 0343US12117467B2Probe chip, scan head, scanning probe microscopy device and use of a probe chipTNO·Filed 2019·Granted Oct 15, 2024·0 cites·18 claims
- 0443US11402404B2Scanning probe microscope and a method for operating thereofTNO·Filed 2019·Granted Aug 2, 2022·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →