Inventor · disambiguated record
Jason Blackstock
Also filed as: BLACKSTOCK JASON · BLACKSTOCK JASON J
12 granted patents·1 pending application·62 citations·filing 2006–2011
89Inventor score
Top patents by PatentIndex Score
13 records- 0191US7639355B2Electric-field-enhancement structure and detection apparatus using sameHEWLETT PACKARD DEVELOPMENT CO·Filed 2007·Granted Dec 29, 2009·20 cites·20 claims
- 0287US7923802B2Method and apparatus for forming a photodiodeHEWLETT PACKARD DEVELOPMENT CO·Filed 2006·Granted Apr 12, 2011·8 cites·7 claims
- 0385US7964925B2Photodiode module and apparatus including multiple photodiode modulesHEWLETT PACKARD DEVELOPMENT CO·Filed 2007·Granted Jun 21, 2011·8 cites·14 claims
- 0480US7592679B1Sensor and method for making the sameHEWLETT PACKARD DEVELOPMENT CO·Filed 2006·Granted Sep 22, 2009·11 cites·15 claims
- 0576US7582975B1Nanowire device and method of making the sameHEWLETT PACKARD DEVELOPMENT CO·Filed 2007·Granted Sep 1, 2009·5 cites·20 claims
- 0674US8202755B2Photodiode module and apparatus including multiple photodiode modulesFATTAL DAVID·Filed 2011·Granted Jun 19, 2012·2 cites·7 claims
- 0773US7466410B2Photonic-based sensors and methods for detecting analytesHEWLETT PACKARD DEVELOPMENT CO·Filed 2007·Granted Dec 16, 2008·3 cites·20 claims
- 0863US7924413B2Nanowire-based photonic devicesHEWLETT PACKARD DEVELOPMENT CO·Filed 2008·Granted Apr 12, 2011·2 cites·20 claims
- 0961US8138013B2Method and apparatus for forming a photodiodeFATTAL DAVID·Filed 2011·Granted Mar 20, 2012·0 cites·13 claims
- 1060US7875480B2Sensor and method for making the sameHEWLETT PACKARD DEVELOPMENT CO·Filed 2009·Granted Jan 25, 2011·3 cites·11 claims
- 1153US7965381B2Self-aligned, sub-wavelength optical lithographyHEWLETT PACKARD DEVELOPMENT CO·Filed 2006·Granted Jun 21, 2011·0 cites·6 claims
- 1252US8268534B2Self-aligned, sub-wavelength optical lithographyFATTAL DAVID·Filed 2011·Granted Sep 18, 2012·0 cites·13 claims
- 1342US2008090160A1Alignment for contact lithographyBLACKSTOCK JASON·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →