Inventor · disambiguated record
Janos Boda
Also filed as: BODA JANOS
4 granted patents·101 citations·filing 1981–1991
79Inventor score
Top patents by PatentIndex Score
4 records- 0174US5406214AMethod and apparatus for measuring minority carrier lifetime in semiconductor materialsSEMILAB FELVEZETO FIZ LAB RT·Filed 1991·Granted Apr 11, 1995·49 cites·23 claims
- 0266US4995939AMethod and apparatus for determining the layer thickness of semiconductor layer structuresMAGYAR TUDOMANYOS AKADEMIA·Filed 1988·Granted Feb 26, 1991·29 cites·13 claims
- 0354US4437060AMethod for deep level transient spectroscopy scanning and apparatus for carrying out the methodMAGYAR TUDOMANYOS AKADEMIA·Filed 1981·Granted Mar 13, 1984·14 cites·8 claims
- 0441US4571541AMethod for determining charged energy states of semiconductor or insulator materials by using deep level transient spectroscopy, and an apparatus for carrying out the methodMAGYAR TUDOMANYOS AKADEMIA·Filed 1982·Granted Feb 18, 1986·9 cites·12 claims
Join the waitlist — get patent alerts
Get an alert when Janos Boda files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →