Inventor · disambiguated record
Jason P. Cain
Also filed as: CAIN JASON P · CAIN JASON PHILLIP
5 granted patents·4 pending applications·46 citations·filing 2005–2016
79Inventor score
Top patents by PatentIndex Score
9 records- 0190US9837398B1Metal track cutting in standard cell layoutsADVANCED MICRO DEVICES INC·Filed 2016·Granted Dec 5, 2017·24 cites·20 claims
- 0282US7875851B1Advanced process control framework using two-dimensional image analysisADVANCED MICRO DEVICES INC·Filed 2006·Granted Jan 25, 2011·9 cites·20 claims
- 0376US7460922B1Scanner optimization for reduced across-chip performance variation through non-contact electrical metrologyADVANCED MICRO DEVICES INC·Filed 2005·Granted Dec 2, 2008·5 cites·20 claims
- 0470US7373215B2Transistor gate shape metrology using multiple data sourcesADVANCED MICRO DEVICES INC·Filed 2006·Granted May 13, 2008·5 cites·19 claims
- 0558US7663766B2Incorporating film optical property measurements into scatterometry metrologyADVANCED MICRO DEVICES INC·Filed 2007·Granted Feb 16, 2010·3 cites·20 claims
- 0646US2009144686A1Method and apparatus for monitoring marginal layout design rulesLENSING KEVIN R·Filed 2007·Application pending·0 cites
- 0745US2009144692A1Method and apparatus for monitoring optical proximity correction performanceCAIN JASON P·Filed 2007·Application pending·0 cites
- 0845US2010310972A1Performing double exposure photolithography using a single reticleCAIN JASON P·Filed 2009·Application pending·0 cites
- 0943US2009082897A1Method and apparatus for generating metrology tags to allow automatic metrology recipe generationCAIN JASON P·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →