Inventor · disambiguated record
Jan Hau Chang
Also filed as: CHANG JAN-HAU
0 granted patents·2 pending applications·0 citations·filing 2023–2024
Files withTAIWAN SEMICONDUCTOR MFG CO LTD2
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2 records- 0160US2025237548A1Instrumental error tracking and identification method, instrumental error tracking and identification system and optical metrology toolTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0246US2024193473A1Semiconductor metrology system and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →