Inventor · disambiguated record
Jaemoo Choi
Also filed as: CHOI JAEMOO
4 granted patents·5 pending applications·0 citations·filing 2022–2024
52Inventor score
Files withSAMSUNG ELECTRONICS CO LTD9
Top patents by PatentIndex Score
9 records- 0157US2025123323A1Semiconductor test device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0254US12074051B2Teaching apparatus and substrate alignment apparatus using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Aug 27, 2024·0 cites·20 claims
- 0353US12105146B2Wafer-level multi-device tester and system including the same preliminary classSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Oct 1, 2024·0 cites·11 claims
- 0452US2024319265A1Semiconductor test devices, systems including the same, and methods for testing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0552US2025138088A1Probe card including power compensation circuit and test system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0651US12309353B2Image sensor test system including operational amplifier and low-frequency attenuatorSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted May 20, 2025·0 cites·18 claims
- 0751US2024053391A1Apparatus for testing image sensor and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0851US2025076381A1Receiving circuit in test device, test system having the same, and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0947US12328424B2Interface board for testing image sensor, test system having the same, and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jun 10, 2025·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →