Inventor · disambiguated record
Jae Young Do
Also filed as: DO JAE YOUNG
12 granted patents·153 citations·filing 1989–2023
89Inventor score
Top patents by PatentIndex Score
12 records- 0185US9684607B2Automatic recovery of application cache warmthMICROSOFT TECHNOLOGY LICENSING LLC·Filed 2015·Granted Jun 20, 2017·5 cites·20 claims
- 0282US5216633ANonvolatile semiconductor memory device including access code circuitrySAMSUNG ELECTRONICS CO LTD·Filed 1991·Granted Jun 1, 1993·72 cites·5 claims
- 0380US12494194B1Machine learning model architecture for incremental asynchronous inferenceAMAZON TECH INC·Filed 2023·Granted Dec 9, 2025·1 cites·20 claims
- 0475US5083045AHigh voltage follower and sensing circuitSAMSUNG ELECTRONICS CO LTD·Filed 1990·Granted Jan 21, 1992·43 cites·21 claims
- 0566US5015886AProgrammable sequential-code recognition circuitSAMSUNG ELECTRONICS CO LTD·Filed 1989·Granted May 14, 1991·21 cites·3 claims
- 0665US10289568B2Application-driven storage systems for a computing systemMICROSOFT TECHNOLOGY LICENSING LLC·Filed 2016·Granted May 14, 2019·1 cites·21 claims
- 0760US10613978B2Application cache replication to secondary application(s)MICROSOFT TECHNOLOGY LICENSING LLC·Filed 2018·Granted Apr 7, 2020·0 cites·25 claims
- 0857US10204048B2Replicating a primary application cache within a secondary application cacheMICROSOFT TECHNOLOGY LICENSING LLC·Filed 2017·Granted Feb 12, 2019·0 cites·20 claims
- 0952US10114765B2Automatic recovery of application cache warmthMICROSOFT TECHNOLOGY LICENSING LLC·Filed 2017·Granted Oct 30, 2018·0 cites·20 claims
- 1051US9684596B2Application cache replication to secondary application(s)MICROSOFT TECHNOLOGY LICENSING LLC·Filed 2015·Granted Jun 20, 2017·0 cites·20 claims
- 1147US5036272APlural test mode selection circuitSAMSUNG ELECTRONICS CO LTD·Filed 1989·Granted Jul 30, 1991·10 cites·12 claims
- 1244US12443368B2Storage device and memory systemSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Oct 14, 2025·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →