Inventor · disambiguated record
Jason E. Doege
Also filed as: DOEGE JASON · DOEGE JASON E
5 granted patents·1 pending application·197 citations·filing 1996–2014
82Inventor score
Top patents by PatentIndex Score
6 records- 0192US5812561AScan based testing of an integrated circuit for compliance with timing specificationsMOTOROLA INC·Filed 1996·Granted Sep 22, 1998·141 cites·22 claims
- 0287US6880137B1Dynamically reconfigurable precision signal delay test system for automatic test equipmentINOVYS·Filed 2002·Granted Apr 12, 2005·38 cites·15 claims
- 0370US7013417B1Dynamically reconfigurable precision signal delay test system for automatic test equipmentINOVYS CORP·Filed 2004·Granted Mar 14, 2006·12 cites·25 claims
- 0457US7114114B1Dynamically reconfigurable precision signal delay test system for automatic test equipmentINOVYS CORP·Filed 2004·Granted Sep 26, 2006·6 cites·25 claims
- 0548US9374219B2Method and apparatus for securing access to an integrated circuitADVANCED MICRO DEVICES INC·Filed 2014·Granted Jun 21, 2016·0 cites·20 claims
- 0642US2005203716A1Method and system for delay defect location when testing digital semiconductor devicesINOVYS CORP·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →