Inventor · disambiguated record
Janos Erdelyi
Also filed as: ERDELYI JANOS
8 granted patents·2 pending applications·224 citations·filing 1982–2014
88Inventor score
Files withINTEGRATION ASSOCIATES INC6RADELKIS ELECTROKEMIAI2INTERGRATION ASSOCIATES INC1MICROCHIP TECH INC1
Top patents by PatentIndex Score
10 records- 0193US7091713B2Method and circuit for generating a higher order compensated bandgap voltageINTEGRATION ASSOCIATES INC·Filed 2004·Granted Aug 15, 2006·66 cites·33 claims
- 0289US7058372B1Method and apparatus for automatic tuning of a resonant loop antennaINTEGRATION ASSOCIATES INC·Filed 2002·Granted Jun 6, 2006·60 cites·12 claims
- 0384US7190933B2Method and apparatus for automatic tuning of a resonant loop antenna in a transceiver circuitINTERGRATION ASSOCIATES INC·Filed 2004·Granted Mar 13, 2007·62 cites·17 claims
- 0468US7164310B1Systems and apparatus for digital control of bias for transistorsINTEGRATION ASSOCIATES INC·Filed 2002·Granted Jan 16, 2007·15 cites·4 claims
- 0560US6690244B2Low phase-noise integrated voltage controlled oscillatorINTEGRATION ASSOCIATES INC·Filed 2001·Granted Feb 10, 2004·8 cites·22 claims
- 0641US9910819B2Two-wire serial interface and protocolMICROCHIP TECH INC·Filed 2014·Granted Mar 6, 2018·0 cites·29 claims
- 0738US2004147281A1Transmitter and receiver circuits with controller-less operation capabilityINTEGRATION ASSOCIATES INC·Filed 2003·Application pending·0 cites
- 0836US4440619AElectro-analytical measuring equipment with measuring cell, comprising integral sensing element and several reference electrodesRADELKIS ELECTROKEMIAI·Filed 1982·Granted Apr 3, 1984·8 cites·5 claims
- 0932US4430164AFault-compensating electro-analytical measuring process and equipmentRADELKIS ELECTROKEMIAI·Filed 1982·Granted Feb 7, 1984·5 cites·5 claims
- 1032US2005221870A1Method and circuit for determining a slow clock calibration factorINTEGRATION ASSOCIATES INC·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →