Inventor · disambiguated record
James Hastings
Also filed as: HASTINGS JAMES · HASTINGS JAMES R · HASTINGS JAMES RAY
6 granted patents·3 pending applications·13 citations·filing 2009–2024
75Inventor score
Top patents by PatentIndex Score
9 records- 0195US11835549B2Thermal array with gimbal features and enhanced thermal performanceADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 5, 2023·3 cites·20 claims
- 0290US12411167B2Tension-based socket gimbal for engaging device under test with thermal arrayADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Sep 9, 2025·1 cites·20 claims
- 0381US12210056B2Thermal array with gimbal features and enhanced thermal performanceADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jan 28, 2025·0 cites·20 claims
- 0477US10281521B2System for thermal management of device under test (DUT)INTEL CORP·Filed 2016·Granted May 7, 2019·3 cites·16 claims
- 0568US8410802B2System including thermal control unit having conduit for dispense and removal of liquid thermal interface materialGUPTA ASHISH·Filed 2009·Granted Apr 2, 2013·6 cites·16 claims
- 0660US2025237697A1Systems and methods for tool-less, quick change elastomeric contact interfaces for integrated circuit testingESSAI INC·Filed 2024·Application pending·0 cites
- 0758US2025321267A1Versatile interposer with diagonal vias for testing of integrated circuit devicesESSAI INC·Filed 2024·Application pending·0 cites
- 0858US2025085309A1Low cross-talk interconnection device with impedance-tuned hybrid shielding structures for integrated circuit device test toolingESSAI INC·Filed 2024·Application pending·0 cites
- 0950US11592472B2Thermal switch for rapid thermal coupling and decoupling of devices under testINTEL CORP·Filed 2019·Granted Feb 28, 2023·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →