Inventor · disambiguated record
Jae Wan Hong
Also filed as: HONG JAE-WAN
10 granted patents·19 citations·filing 2005–2023
83Inventor score
Files withQUAD MINERS3KOREA RES INST OF STANDARDS2PARK BYONG CHON2HONG JAE WAN1HYUNDAI MOTOR CO LTD1
Top patents by PatentIndex Score
10 records- 0177US8153338B2Apparatus and method for repairing photo maskPARK BYONG CHON·Filed 2010·Granted Apr 10, 2012·6 cites·10 claims
- 0275US11838196B2Network forensic system and methodQUAD MINERS·Filed 2020·Granted Dec 5, 2023·1 cites·11 claims
- 0373US7501618B2Deformation method of nanometer scale material using particle beam and nano tool therebyKOREA RES INST OF STANDARDS·Filed 2007·Granted Mar 10, 2009·5 cites·12 claims
- 0472US12231322B2Network forensic system and methodQUAD MINERS·Filed 2023·Granted Feb 18, 2025·0 cites·15 claims
- 0572US12199853B2Network forensic system and methodQUAD MINERS·Filed 2023·Granted Jan 14, 2025·0 cites·18 claims
- 0670US7703147B2Method for fabricating SPM and CD-SPM nanoneedle probe using ion beam and SPM and CD-SPM nanoneedle probe therebyKOREA RES INST OF STANDARDS·Filed 2005·Granted Apr 20, 2010·6 cites·26 claims
- 0765US8853285B2Polymer electrolyte membrane chemically bonded with ionic liquid and fuel cell using the sameHYUNDAI MOTOR CO LTD·Filed 2012·Granted Oct 7, 2014·1 cites·17 claims
- 0852US10222414B2Apparatus and method for exchanging probeSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Mar 5, 2019·0 cites·20 claims
- 0938US9009861B2Substrate measurement apparatus with electron distortion unitPARK BYONG CHON·Filed 2011·Granted Apr 14, 2015·0 cites·10 claims
- 1037US8434159B2AFM measuring method and system thereofHONG JAE WAN·Filed 2010·Granted Apr 30, 2013·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →