Inventor · disambiguated record
Jae Suk Hwang
Also filed as: HWANG JAE SUK
7 granted patents·1 citations·filing 2013–2021
70Inventor score
Top patents by PatentIndex Score
7 records- 0170US11486896B2Contact and test socket device for testing semiconductor deviceHWANG DONG WEON·Filed 2021·Granted Nov 1, 2022·0 cites·10 claims
- 0270US11486897B2Contact and test socket device for testing semiconductor deviceHWANG DONG WEON·Filed 2021·Granted Nov 1, 2022·0 cites·10 claims
- 0362US10241132B2Socket apparatus for semiconductor device testHWANG DONG WEON·Filed 2015·Granted Mar 26, 2019·1 cites·20 claims
- 0460US10935572B2Contact and test socket device for testing semiconductor deviceHWANG DONG WEON·Filed 2017·Granted Mar 2, 2021·0 cites·15 claims
- 0551US10761110B2Contact for testing semiconductor device, and test socket device thereforHWANG DONG WEON·Filed 2018·Granted Sep 1, 2020·0 cites·28 claims
- 0641US9494616B2Socket device for testing semiconductor deviceHICON CO LTD·Filed 2013·Granted Nov 15, 2016·0 cites·7 claims
- 0740US10094852B2Spring contactHICON CO LTD·Filed 2013·Granted Oct 9, 2018·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →