Inventor · disambiguated record
Jae Chol Joo
Also filed as: JOO JAE CHOL
2 granted patents·2 pending applications·0 citations·filing 2013–2017
22Inventor score
Files withSAMSUNG ELECTRONICS CO LTD4
Top patents by PatentIndex Score
4 records- 0144US2013247589A1Position measuring system and methodSAMSUNG ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
- 0239US10733719B2Wafer inspection apparatus and wafer inspection method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Aug 4, 2020·0 cites·3 claims
- 0336US10431505B2Method of inspecting surface having a minute pattern based on detecting light reflected from metal layer on the surfaceSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Oct 1, 2019·0 cites·11 claims
- 0434US2018144995A1Optical inspection apparatus and method and method of fabricating semiconductor device using the apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →