Inventor · disambiguated record
Jacob Karin
Also filed as: KARIN JACOB
5 granted patents·6 pending applications·77 citations·filing 1988–2005
79Inventor score
Files withACCRETECH ISRAEL LTD5TOKYO SEIMITSU ISRAEL LTD2AKSELROD SOLANGE1ITZKOVITCH MORDECHAI1TOKYO SEIMITSO ISRAEL LTD1
Top patents by PatentIndex Score
11 records- 0157US4945917AMethod and apparatus for indicating repetition intervals of a specified component of a composite electrical signal, particularly useful for displaying fetal r-wavesAKSELROD SOLANGE·Filed 1988·Granted Aug 7, 1990·59 cites·20 claims
- 0245US6824056B1Auto-focus method for a scanning microscopeACCRETECH ISRAEL LTD·Filed 2003·Granted Nov 30, 2004·4 cites·16 claims
- 0344US6603589B2Circular scanning patternsTOKYO SEIMITSU ISRAEL LTD·Filed 2002·Granted Aug 5, 2003·7 cites·12 claims
- 0442US6735005B2Cartesian scanning systemTOKYO SEIMITSO ISRAEL LTD·Filed 2002·Granted May 11, 2004·4 cites·47 claims
- 0538US7037012B2Scanning mechanism for high-speed high-resolution scanningZIV AV ENGINEERING LTD·Filed 2003·Granted May 2, 2006·3 cites·16 claims
- 0638US2006033035A1Electron microscope array for inspection and lithographyITZKOVITCH MORDECHAI·Filed 2005·Application pending·0 cites
- 0736US2004075879A1Multiple scanning system and methodACCRETECH ISRAEL LTD·Filed 2003·Application pending·0 cites
- 0836US2003081826A1Tilted scan for Die-to-Die and Cell-to-Cell detectionTOKYO SEIMITSU ISRAEL LTD·Filed 2002·Application pending·0 cites
- 0931US2005111082A1Confocal microscopy arrangement without beam splitterACCRETECH ISRAEL LTD·Filed 2003·Application pending·0 cites
- 1031US2004051976A1Confocal microscope with diffractively formed virtual pinhole arrayACCRETECH ISRAEL LTD·Filed 2002·Application pending·0 cites
- 1130US2004140417A1Image sensor for confocal microscopyACCRETECH ISRAEL LTD·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →